Nearfield Instruments, A*STAR IME To Advance AI Chip Metrology In Singapore

KUALA LUMPUR, May 21 (Bernama) -- Nearfield Instruments, a leader in advanced semiconductor metrology, has entered a multi-year research collaboration with Singapore’s A*STAR Institute of Microelectronics (A*STAR IME) to drive innovation in semiconductor metrology technologies.

By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR IME’s cutting-edge semiconductor research, the partnership will accelerate the development of advanced metrology solutions that enable efficient artificial intelligence (AI) chip production.

Nearfield chief executive officer, Hamed Sadeghian in a statement, emphasised the importance of hybrid bonding and precision metrology in scaling AI chip production while reducing energy waste.

Meanwhile, A*STAR IME Executive Director, Terence Gan highlighted the collaboration’s role in driving innovation to ensure high yields and efficient manufacturing of AI and high-performance computing chips.

This collaboration aligns with Singapore’s continuous efforts to strengthen its semiconductor industry through strategic partnerships with global technology leaders.

The rapid growth of AI is significantly increasing the demand for computing power, opening new avenues for innovation in semiconductor technologies.

As conventional methods of scaling semiconductors approach their limits, the industry is increasingly adopting heterogeneous integration—an advanced packaging of different types of chips into a single system—to deliver superior performance and improved energy efficiency.

However, this shift brings added complexity to the manufacturing process, highlighting the essential role of precision metrology and strict process control in maintaining production quality and efficiency.

-- BERNAMA